DocumentCode :
1419656
Title :
Computer simulation of ion trapping and detrapping in a PPM focused traveling wave tube
Author :
Thorington, Charles B.
Author_Institution :
Boeing Electron. Dynamics Devices Inc., Torrance, CA, USA
Volume :
48
Issue :
1
fYear :
2001
fDate :
1/1/2001 12:00:00 AM
Firstpage :
56
Lastpage :
61
Abstract :
This paper presents results from a time-dependent, electrostatic electron gun simulation code, simulating ion trapping and detrapping in a traveling wave tube (TWT) focused by periodic permanent magnets (PPM). The simulations described indicate that ion loss is primarily radial through the beam tunnel walls, rather than axial through the gun or collector. The electrostatic potential well formed by the electron beam is constantly being filled by ionization of a background neutral gas. This effect constitutes the primary ion loss mechanism. Filling of the potential well is made possible by loss of the low energy electrons produced by ionization (secondary electrons) through periodic nulls in the magnetic field
Keywords :
digital simulation; electron beam focusing; electron guns; particle traps; permanent magnets; travelling wave tubes; PPM focusing; background neutral gas ionisation; beam tunnel walls; electrostatic electron gun; electrostatic potential well; ion detrapping; ion loss; ion trapping; low energy electrons; periodic nulls; simulation code; traveling wave tube; Computational modeling; Computer simulation; Electron beams; Electron traps; Electron tubes; Electrostatics; Filling; Ionization; Permanent magnets; Potential well;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.892167
Filename :
892167
Link To Document :
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