DocumentCode :
1419699
Title :
Transient ion disturbances in traveling wave tubes
Author :
Tighe, William ; Goebel, Dan M. ; Thorington, Charles B.
Author_Institution :
Boeing Electron. Dynamic Devices Inc., Torrance, CA, USA
Volume :
48
Issue :
1
fYear :
2001
fDate :
1/1/2001 12:00:00 AM
Firstpage :
82
Lastpage :
87
Abstract :
It is well known that the presence of ions in the electron beam of a traveling wave tube (TWT) can lead to periodic variations in the output power, phase and the body (or helix) current. This has been referred to as ion noise or jitter. Recently, we have observed a different form of jitter, and while it is still observed as a small variation in the TWT output (typically <0.5 dB in power and 2° in phase), it is not periodic. We refer to this phenomenon as random jitter, since its random nature in time is a defining characteristic, Other characteristics include a relatively fast onset (~1 ms) and slow (~500 ms) recovery. It was found that random jitter was due to the spurious release of extremely small amounts of trapped gas inside the TWT. The source of the gas was identified and the problem was resolved. The observed level of fluctuations in power and phase had no effect on digital traffic and the small quantity of gas was found to have no measurable impact on cathode life
Keywords :
electron device noise; fluctuations; ions; jitter; transients; travelling wave tubes; Ar; Ar gas; TWT electron beam; body current; helix current; ion noise; nonperiodic variations; output power; phase fluctuations; phase variations; power fluctuations; random jitter; spurious gas release; transient ion disturbances; trapped gas; traveling wave tubes; Cathodes; Dielectrics; Electron beams; Electron traps; Electron tubes; Fluctuations; Jitter; Power generation; Power measurement; Radio frequency;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.892172
Filename :
892172
Link To Document :
بازگشت