Limits on Integration as Determined by Power Dissipation and Signal-to-Noise Ratio in Loss-Compensated Photonic Integrated Circuits Based on Metal/Quantum-Dot Materials

Author

Thylén, Lars ; Holmström, Petter ; Bratkovsky, Alexander ; Li, Jingjing ; Wang, Shih-Yuan

Author_Institution

Dept. of Microelectron. & Appl. Phys., R. Inst. of Technol. (KTH), Kista, Sweden

Volume

46

Issue

4

fYear

2010

fDate

4/1/2010 12:00:00 AM

Firstpage

518

Lastpage

524

Abstract

We analyze the power dissipation that is associated with using the gain of an embedded medium (quantum dots) to overcome the losses inherent in plasmonics systems employed to produce a negative dielectric constant for nanophotonics circuits. This power dissipation is primarily due to the dissipative losses in the metal structures and Auger recombination in the quantum dots. The impact of amplifier mediated signal-to-noise ratio (SNR) degradation and its effect on integration is analyzed, and a tradeoff between low power dissipation and SNR is quantified.

Keywords

Auger effect; amplifiers; integrated optics; metals; metamaterials; nanophotonics; optical losses; optical waveguides; plasmonics; quantum dots; Auger recombination; amplifier; dissipative losses; loss-compensated photonic integrated circuits; metal-quantum dot materials; nanophotonics circuits; negative dielectric constant; plasmonics systems; power dissipation; signal-to-noise ratio; Dielectric constant; Dielectric losses; Dielectric materials; Inorganic materials; Optical losses; Photonic integrated circuits; Plasmons; Power dissipation; Quantum dots; Signal to noise ratio; Amplifier noise; gain; photonic integration; plasmonics; quantum dots;

fLanguage

English

Journal_Title

Quantum Electronics, IEEE Journal of

Publisher

ieee

ISSN

0018-9197

Type

jour

DOI

10.1109/JQE.2009.2036743

Filename

5415798