Title :
2
Reader Design Outlook
Author :
Chen, Yonghua ; Song, Dion ; Qiu, Jiaoming ; Kolbo, Paul ; Wang, Lei ; He, Qing ; Covington, Mark ; Stokes, Scott ; Sapozhnikov, Victor ; Dimitrov, Dimitar ; Gao, Kaizhong ; Miller, Bradley
Author_Institution :
Seagate Technol., Bloomington, MN, USA
fDate :
3/1/2010 12:00:00 AM
Abstract :
We review the 2 Tbit/in2 reader design landscape based on existing knowledge and projection. We found that the reader signal-to-noise ratio (SNR) requirement will be highly challenging due to the rapid increase in noise and the additional requirements from assisted writing. An acceptable level of channel bit density can be achieved in spite of a slow head-to-media spacing (HMS) reduction provided that both the shield-to-shield (SS) spacing and the ¿a¿ parameter scale with the bit length. We expect the side reading control for high ktpi to be difficult, and potentially a reader side shield will be required. The reader will likely use a higher quality MgO tunneling giant magnetoresistance (TGMR) stack with improved permanent-magnet coercivity. Certain new structures such as the differential reader or the trilayer will likely be part of the solution.
Keywords :
coercive force; disc drives; giant magnetoresistance; hard discs; magnesium compounds; magnetic heads; magnetic multilayers; magnetic recording noise; magnetic shielding; magnetoresistive devices; permanent magnets; reviews; tunnelling magnetoresistance; MgO; SNR; assisted writing; bit length; channel bit density; differential reader; hard disk drive; head-media spacing reduction; magnetic head; magnetic trilayer; permanent-magnet coercivity; reader design outlook; reader side shield; review; shield-shield spacing; side reading control; signal-noise ratio; tunneling giant magnetoresistance stack; Damping; Low-frequency noise; Magnetic field measurement; Magnetic heads; Magnetic moments; Magnetic noise; Magnetic recording; Noise measurement; Thermal resistance; Voltage; Giant magnetoresistance; magnetic heads; tunneling;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2010.2041040