Title :
Accurate and efficient method of jitter and noise separation and its application to ADC testing
Author :
Li Xu ; Degang Chen
Author_Institution :
Dept. of Electr. & Comput. Eng., Iowa State Univ., Ames, IA, USA
Abstract :
Jitter is a crucial factor in high speed and high performance ADC testing. This paper proposes an efficient and accurate jitter estimation method based on one frequency measurement. Applying simple mathematical processing to the ADC output in time domain, the RMS of jitter and noise power are obtained. Furthermore, prior information of harmonics does not need to know before the processing. The algorithm is robust enough that non-harmonic spurs does not affect the estimation result. Using the proposed algorithm, specifications of SNR and ENOB of the ADC under test can be obtained without jitter effect. Simulation results of ADCs with different resolutions show the functionality and accuracy of the method.
Keywords :
analogue-digital conversion; circuit noise; circuit testing; frequency measurement; jitter; ADC testing; ENOB; RMS; SNR; analog-to-digital converter; frequency measurement; jitter estimation method; jitter separation; noise power; noise separation; time domain; Clocks; Equations; Harmonic analysis; Jitter; Signal to noise ratio; Testing; Analog-to-Digital Converter; jitter; noise; single frequency; spectral testing;
Conference_Titel :
VLSI Test Symposium (VTS), 2014 IEEE 32nd
Conference_Location :
Napa, CA
DOI :
10.1109/VTS.2014.6818743