DocumentCode :
1420164
Title :
Simulation of SOI devices and circuits using BSIM3SOI
Author :
Sinitsky, D. ; Tang, S. ; Jangity, A. ; Assaderaghi, F. ; Shahidi, G. ; Chenming Hu
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
Volume :
19
Issue :
9
fYear :
1998
Firstpage :
323
Lastpage :
325
Abstract :
A versatile SOI model derived from the BSIM3v3 bulk MOSFET model is capable of simulating partially and fully depleted devices with options for self-heating and floating body effects. The model can automatically switch between fully and partially depleted regimes. After refining body current models we for the first time present successful dc and transient device and circuit simulation of an SOI MOSFET technology with L/sub eff/ below 0.2 μm.
Keywords :
MOS integrated circuits; MOSFET; circuit analysis computing; digital simulation; semiconductor device models; silicon-on-insulator; transient analysis; 0.2 micron; BSIM3SOI; SOI devices; SOI model; body current models; bulk MOSFET model; dc simulation; floating body effects; fully depleted devices; partially depleted devices; self-heating effects; transient simulation; Circuit simulation; Data mining; Doping profiles; Impact ionization; MOSFET circuits; Pulse measurements; Semiconductor diodes; Semiconductor films; Semiconductor process modeling; Switches;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/55.709628
Filename :
709628
Link To Document :
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