Title :
A built-in self-test technique for load inductance and lossless current sensing of DC-DC converters
Author :
Tao Liu ; Chao Fu ; Ozev, Sule ; Bakkaloglu, Bertan
Author_Institution :
Arizona State Univ., Tempe, AZ, USA
Abstract :
One of the major problems associated with integrated DC-DC converters used in state of the art Power Management ICs (PMICs) is dynamic performance and stability degradation due to off-chip component and output current variations. A high accuracy built-in self-test (BIST) architecture measuring load inductance and DC resistance (DCR) of DC-DC converters is presented. The DCR measurement of the inductor also enables continuous, lossless average load current sensing of the DC-DC converter across the inductor. Both the BIST circuit and the primary signal chain utilize low analog complexity frequency-domain ΔΣADC. The ΔΣADC decimation filter nulls also provide current ripple cancellation and average current extraction. The BIST module can measure filter inductance values ranging from 3.6μH to 22.3μH range with average 2.0% error and inductor DCR 13mΩto 68mΩ range with average 2.1% error. The average current sensing enabled by the BIST technique achieves current measurement accuracy with average 2.3% error for 0.1A-1A range load current. BIST and current sensing modules occupy less than 6% of total chip area. The BIST circuitry is fabricated and tested with a 12V input, 1V-11.5V output range, for a 3W output power digital DC-DC converter.
Keywords :
DC-DC power convertors; analogue-digital conversion; built-in self test; delta-sigma modulation; inductance; DC-DC converters; analog-digital converter; built-in self test technique; decimation filter; frequency domain delta-sigma ADC; load inductance; lossless current sensing; off-chip component; output current variation; power 3 W; power management IC; voltage 1 V to 11.5 V; voltage 12 V; Built-in self-test; Current measurement; Inductance; Inductance measurement; Inductors; Loss measurement; Sensors;
Conference_Titel :
VLSI Test Symposium (VTS), 2014 IEEE 32nd
Conference_Location :
Napa, CA
DOI :
10.1109/VTS.2014.6818750