DocumentCode :
142032
Title :
Innovative practices session 3C: Solving today´s test challenges
Author :
Kim, John ; Meyer, Wolfgang ; Mak, T.M. ; Majumdar, Amitava
Author_Institution :
Synopsys
fYear :
2014
fDate :
13-17 April 2014
Firstpage :
1
Lastpage :
1
Abstract :
Test vehicles are commonly used to understand the characteristics of a new process node. The ability to precisely identify and isolate defects is a key requirement during yield learning on these vehicles. Efficiently utilizing the fanouts in a design is critical to get a smaller pfa area. In this talk, we introduce the concept High Observability Patterns. High observability patterns target the detection of a defect in multiple patterns using multiple and different observe points. This allows the diagnostics engine to more precisely identify where the defect is and thus reducing the PFA area.
Keywords :
Abstracts; Clocks; Discrete Fourier transforms; Observability; Three-dimensional displays; Vehicle dynamics; Vehicles;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium (VTS), 2014 IEEE 32nd
Conference_Location :
Napa, CA, USA
Type :
conf
DOI :
10.1109/VTS.2014.6818756
Filename :
6818756
Link To Document :
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