• DocumentCode
    142032
  • Title

    Innovative practices session 3C: Solving today´s test challenges

  • Author

    Kim, John ; Meyer, Wolfgang ; Mak, T.M. ; Majumdar, Amitava

  • Author_Institution
    Synopsys
  • fYear
    2014
  • fDate
    13-17 April 2014
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    Test vehicles are commonly used to understand the characteristics of a new process node. The ability to precisely identify and isolate defects is a key requirement during yield learning on these vehicles. Efficiently utilizing the fanouts in a design is critical to get a smaller pfa area. In this talk, we introduce the concept High Observability Patterns. High observability patterns target the detection of a defect in multiple patterns using multiple and different observe points. This allows the diagnostics engine to more precisely identify where the defect is and thus reducing the PFA area.
  • Keywords
    Abstracts; Clocks; Discrete Fourier transforms; Observability; Three-dimensional displays; Vehicle dynamics; Vehicles;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium (VTS), 2014 IEEE 32nd
  • Conference_Location
    Napa, CA, USA
  • Type

    conf

  • DOI
    10.1109/VTS.2014.6818756
  • Filename
    6818756