DocumentCode
142032
Title
Innovative practices session 3C: Solving today´s test challenges
Author
Kim, John ; Meyer, Wolfgang ; Mak, T.M. ; Majumdar, Amitava
Author_Institution
Synopsys
fYear
2014
fDate
13-17 April 2014
Firstpage
1
Lastpage
1
Abstract
Test vehicles are commonly used to understand the characteristics of a new process node. The ability to precisely identify and isolate defects is a key requirement during yield learning on these vehicles. Efficiently utilizing the fanouts in a design is critical to get a smaller pfa area. In this talk, we introduce the concept High Observability Patterns. High observability patterns target the detection of a defect in multiple patterns using multiple and different observe points. This allows the diagnostics engine to more precisely identify where the defect is and thus reducing the PFA area.
Keywords
Abstracts; Clocks; Discrete Fourier transforms; Observability; Three-dimensional displays; Vehicle dynamics; Vehicles;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium (VTS), 2014 IEEE 32nd
Conference_Location
Napa, CA, USA
Type
conf
DOI
10.1109/VTS.2014.6818756
Filename
6818756
Link To Document