Innovative practices session 5C: Machine learning and data analysis in test

Finding the cause of yield and reliability issues has never been an easy task for the product and test engineer. The challenge continues to grow as processes add more steps and contain more complicated interactions, as designs are pushed to the limits of the process capabilities to meet their market requirements, as DPPM requirements continue to lower, and as test costs do not scale well. Test data has continued to become more critical in quickly resolving issues for fast ramps and maintenance of quality levels. However, the analysis methods are becoming more sophisticated and data intensive. This presentation will review some case studies, what was learned, and some observations.