DocumentCode
142076
Title
Special session 8A: E.J. McCluskey Doctoral Thesis Award semi-final
Author
Portolan, M. ; Maniatakos, Michail ; Maniatakos, Michail
Author_Institution
Alcatel-Lucent
fYear
2014
fDate
13-17 April 2014
Firstpage
1
Lastpage
1
Abstract
Named after Prof. E.J. McCluskey, a key contributor to the field of test technology, the 2014 TTTC´s Doctoral Thesis Award serves the purpose to i) promote the most impactful doctoral student work, ii) provide the students with the exposure to the community and the prospective employers, and iii) support interaction between academia and industry in the field of test technology. TTTC´s E.J. McCluskey Best Doctoral Thesis Award will be given to the winning student of the doctoral student contest and his or her advisor. The award consists of a certificate, an honorarium and an invitation to submit a paper on the presented work to the IEEE Design & Test magazine.
Keywords
Awards activities; Communities; Educational institutions; Europe; Industries; Medical services; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium (VTS), 2014 IEEE 32nd
Conference_Location
Napa, CA, USA
Type
conf
DOI
10.1109/VTS.2014.6818779
Filename
6818779
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