Title :
Special session 8C: Hot topic: Designers´ and test researchers´ roles in analog design-for-test
Author :
Ishida, Masahiro ; Yamaguchi, Takahiro J. ; Soma, Mani ; Fiez, Terri ; Li, Mike Peng
Author_Institution :
ADVANTEST Corporation
Abstract :
Recent analog designers do think about measurement at design time. Analog design-for-measurement is a real success, not based on test research but based on designers´ incorporation of calibration methods to ensure that their circuits work within specifications. In the meantime, mixed-signal test research has not kept pace with new design architectures, and some analog designers have outpaced mixed-signal test/design-for-test researchers. This session will elucidate the key factors for this success and the differences between design and test. And the session will discusses a designers´ and test researchers´ roles on analog design-for-test from each viewpoint, and some challenges on collaborating designers and test researchers.
Keywords :
Abstracts; Calibration; Design for testability; Educational institutions; Laboratories; Time measurement; Very large scale integration;
Conference_Titel :
VLSI Test Symposium (VTS), 2014 IEEE 32nd
Conference_Location :
Napa, CA, USA
DOI :
10.1109/VTS.2014.6818781