• DocumentCode
    142087
  • Title

    Phase-locked loop design with SPO detection and charge pump trimming for reference spur suppression

  • Author

    Sen-Wen Hsiao ; Chung-Chun Chen ; Caplan, Randy ; Galloway, Jesse ; Gray, Bryce ; Chatterjee, Avhishek

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
  • fYear
    2014
  • fDate
    13-17 April 2014
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    As an important factor for long-term jitter in clock synthesis and distribution, reference spurs result from circuit mismatch and nonlinear effects that induce periodic perturbations in phase-locked loops (PLLs). In this paper, a PLL with built-in static phase offset (SPO) detector and charge pump current trimming for self-calibration circuits is proposed. By adjusting the charge pump current ratio determined by an SPO detector, minimum and maximum improvements of 12dB and 22.99dB in reference spur suppression can be achieved. The best improvement reduces the integrated jitter by 10% over a 10kHz to 10MHz bandwidth. The technique is demonstrated for a PLL output frequency from 400 MHz to 1 GHz. The ring oscillator based PLL is designed with 200 KHz bandwidth and 70 degree phase margin. Measurement results from chips across different corners are provided to verify the calibration technique.
  • Keywords
    charge pump circuits; clocks; phase detectors; phase locked loops; SPO detection; built-in static phase offset detector; charge pump current trimming; charge pump trimming; circuit mismatch; clock distribution; clock synthesis; frequency 400 MHz to 1 GHz; long term jitter; nonlinear effect; phase locked loop design; reference spur suppression; ring oscillator; self-calibration circuits; Calibration; Charge pumps; Detectors; Discharges (electric); Jitter; Phase frequency detector; Phase locked loops; BIST; PLL; SPO; charge pump; current mismtach; frequency synthesizer; long-term jitter; reference spur;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium (VTS), 2014 IEEE 32nd
  • Conference_Location
    Napa, CA
  • Type

    conf

  • DOI
    10.1109/VTS.2014.6818785
  • Filename
    6818785