Title :
Analysis, estimation and reduction of simultaneous switching noise
Author :
Abderrahman, A. ; Savaria, Y. ; Kaminska, B.
Author_Institution :
Département de génie électrique et de génie informatique, École Polytechnique de Montréal, B.P. 6079, succursale “centre-ville”, Montréal, Qué., H3C 3A7
Abstract :
The performance of digital and mixed circuits is affected and limited by the simultaneous switching power and ground noise. This kind of noise is related to interconnections and packaging. The latter two factors play a major role in high-speed-circuit design and may become a dominant factor limiting the performance of future ULSI components. As a result, it is imperative to understand and to master the problems and subtleties arising from interconnections and packaging. Among these problems, that of simultaneous switching noise is taking on more and more importance as circuits become faster and their I/O pin count increases. This paper reviews the state of current research regarding how to analyze, estimate and reduce simultaneous switching noise.
Keywords :
Estimation; Fluctuations; Noise; Resistance; Resonant frequency; Transistors; Very large scale integration;
Journal_Title :
Electrical and Computer Engineering, Canadian Journal of
DOI :
10.1109/CJECE.1996.7101991