Functional block extraction for hardware security detection using time-integrated and time-resolved emission measurements

Author

Stellari, Franco ; Peilin Song ; Ainspan, Herschel A.

Author_Institution

IBM T.J. Watson Res. Center, Yorktown Height, NY, USA

fYear

2014

fDate

13-17 April 2014

Firstpage

1

Lastpage

6

Abstract

This paper presents a novel and powerful methodology for extracting functional blocks in hardware security and Trojan detection applications. The method is based on our proposed tester-based optical methodology that combines different test patterns, time-integrated and time-resolved emission measurements to identify and localize logic state changes and functional block activity inside a chip in a non invasive fashion. Detailed examples using a mixed-signal chip are presented and discussed to explain our proposed method.

Keywords

copy protection; industrial property; integrated circuit design; integrated circuit testing; security of data; Trojan detection application; functional block activity; functional block extraction; hardware security detection; localize logic state changes; test pattern; tester based optical methodology; time integrated emission measurement; time resolved emission measurement; Cameras; Logic gates; Optical device fabrication; Optical imaging; Optical variables measurement; Semiconductor device measurement; Voltage-controlled oscillators; Tester-based test methodology; hardware security; reverse engineering; time-integrated and time-resolved emission;

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Test Symposium (VTS), 2014 IEEE 32nd

Conference_Location

Napa, CA

Type

conf

DOI

10.1109/VTS.2014.6818792

Filename

6818792