Title :
Special session 11B: ITRS adaptive test update
Author_Institution :
Texas Instruments
Abstract :
A lot has changed in two years. This presentation will review what is new for the Y2013 ITRS major revision. This revision focuses more on explaining adaptive test beyond the expert users. What are emerging opportunities/challenges? What are the biggest upcoming bottlenecks?
Keywords :
Abstracts; Adaptive systems; Assembly; Foundries; Next generation networking; Very large scale integration;
Conference_Titel :
VLSI Test Symposium (VTS), 2014 IEEE 32nd
Conference_Location :
Napa, CA, USA
DOI :
10.1109/VTS.2014.6818799
