• DocumentCode
    142109
  • Title

    Special session 11B: ITRS adaptive test update

  • Author

    Carulli, John

  • Author_Institution
    Texas Instruments
  • fYear
    2014
  • fDate
    13-17 April 2014
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    A lot has changed in two years. This presentation will review what is new for the Y2013 ITRS major revision. This revision focuses more on explaining adaptive test beyond the expert users. What are emerging opportunities/challenges? What are the biggest upcoming bottlenecks?
  • Keywords
    Abstracts; Adaptive systems; Assembly; Foundries; Next generation networking; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium (VTS), 2014 IEEE 32nd
  • Conference_Location
    Napa, CA, USA
  • Type

    conf

  • DOI
    10.1109/VTS.2014.6818799
  • Filename
    6818799