DocumentCode
142109
Title
Special session 11B: ITRS adaptive test update
Author
Carulli, John
Author_Institution
Texas Instruments
fYear
2014
fDate
13-17 April 2014
Firstpage
1
Lastpage
1
Abstract
A lot has changed in two years. This presentation will review what is new for the Y2013 ITRS major revision. This revision focuses more on explaining adaptive test beyond the expert users. What are emerging opportunities/challenges? What are the biggest upcoming bottlenecks?
Keywords
Abstracts; Adaptive systems; Assembly; Foundries; Next generation networking; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium (VTS), 2014 IEEE 32nd
Conference_Location
Napa, CA, USA
Type
conf
DOI
10.1109/VTS.2014.6818799
Filename
6818799
Link To Document