• DocumentCode
    142116
  • Title

    Hot topic session 12B: Stay relevant with standards-based DFT

  • Author

    Clark, C J ; Champac, Victor

  • Author_Institution
    Intellitech Corp.
  • fYear
    2014
  • fDate
    13-17 April 2014
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    IEEE 1149.1-2013 provides compatible IEEE 1500 Wrapper Serial Port access for on-chip DFT and instrumentation access. This presentation shows how IEEE 1149.1-2013 integrates with IEEE 1500 WSPs and adds new capabilities such as wrapper segmentation for low power designs. Example architectures are presented with BSDL descriptions of IEEE 1500 WIRs and wrappers.
  • Keywords
    Abstracts; Bandwidth; Discrete Fourier transforms; Instruments; Random access memory; System-on-chip; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium (VTS), 2014 IEEE 32nd
  • Conference_Location
    Napa, CA, USA
  • Type

    conf

  • DOI
    10.1109/VTS.2014.6818802
  • Filename
    6818802
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=142116