• DocumentCode
    1421219
  • Title

    Hierarchical Lithography for Generating Molecular Testbeds

  • Author

    Rahman, Masudur M. ; Norton, Michael L.

  • Author_Institution
    Dept. of Chem., Marshall Univ., Huntington, WV, USA
  • Volume
    10
  • Issue
    3
  • fYear
    2010
  • fDate
    3/1/2010 12:00:00 AM
  • Firstpage
    498
  • Lastpage
    502
  • Abstract
    Progress in molecular optoelectronic sensor development requires the production of nanostructures, which control the orientation and presentation of individual molecular species. Indeed, the prospect of producing nanochips with several different molecular sensors surface mounted on a 100 nm × 100 nm chip is clearly realizable. In order to gain the greatest advantage from this miniaturization, ordering, in the form of indexed localization of these nanostructures, is also required. It is unlikely that any one lithographic method will prove satisfactory for pattern production at the multiple size scales currently targeted for sensor integration. This paper targets the context of the device prototype development laboratory, where direct write methods may not be available or optimal. Two different, accessible types of lithography, with overlapping ranges of resolution, are used to create the multiple size scale levels of patterning required for the generation of testbeds for single molecule studies. Digital optical projection lithography provides for fast prototyping and large scale indexing features from the macro scale to the ~5 ¿m scale. The intermediate scale, from 10 ¿ m to 100 nm is addressed using phase-shift lithography. These combined techniques provide indexing at a resolution compatible with addressing individual molecular lithography structures, particularly DNA origami, which in turn can be used to localize species in the 100 to ~10 nm range.
  • Keywords
    lithography; nanofabrication; nanosensors; optoelectronic devices; hierarchical lithography; molecular optoelectronic sensor development; molecular sensors; molecular testbeds generation; nanostructures; optical projection lithography; phase-shift lithography; size 0.01 nm to 100 nm; Indexing; Laboratories; Lithography; Nanostructures; Optical sensors; Optoelectronic and photonic sensors; Production; Prototypes; Test pattern generators; Testing; Molecular testbeds; phase-shift lithography (PSL); projection lithography; single molecule;
  • fLanguage
    English
  • Journal_Title
    Sensors Journal, IEEE
  • Publisher
    ieee
  • ISSN
    1530-437X
  • Type

    jour

  • DOI
    10.1109/JSEN.2009.2038573
  • Filename
    5416591