DocumentCode
1421219
Title
Hierarchical Lithography for Generating Molecular Testbeds
Author
Rahman, Masudur M. ; Norton, Michael L.
Author_Institution
Dept. of Chem., Marshall Univ., Huntington, WV, USA
Volume
10
Issue
3
fYear
2010
fDate
3/1/2010 12:00:00 AM
Firstpage
498
Lastpage
502
Abstract
Progress in molecular optoelectronic sensor development requires the production of nanostructures, which control the orientation and presentation of individual molecular species. Indeed, the prospect of producing nanochips with several different molecular sensors surface mounted on a 100 nm à 100 nm chip is clearly realizable. In order to gain the greatest advantage from this miniaturization, ordering, in the form of indexed localization of these nanostructures, is also required. It is unlikely that any one lithographic method will prove satisfactory for pattern production at the multiple size scales currently targeted for sensor integration. This paper targets the context of the device prototype development laboratory, where direct write methods may not be available or optimal. Two different, accessible types of lithography, with overlapping ranges of resolution, are used to create the multiple size scale levels of patterning required for the generation of testbeds for single molecule studies. Digital optical projection lithography provides for fast prototyping and large scale indexing features from the macro scale to the ~5 ¿m scale. The intermediate scale, from 10 ¿ m to 100 nm is addressed using phase-shift lithography. These combined techniques provide indexing at a resolution compatible with addressing individual molecular lithography structures, particularly DNA origami, which in turn can be used to localize species in the 100 to ~10 nm range.
Keywords
lithography; nanofabrication; nanosensors; optoelectronic devices; hierarchical lithography; molecular optoelectronic sensor development; molecular sensors; molecular testbeds generation; nanostructures; optical projection lithography; phase-shift lithography; size 0.01 nm to 100 nm; Indexing; Laboratories; Lithography; Nanostructures; Optical sensors; Optoelectronic and photonic sensors; Production; Prototypes; Test pattern generators; Testing; Molecular testbeds; phase-shift lithography (PSL); projection lithography; single molecule;
fLanguage
English
Journal_Title
Sensors Journal, IEEE
Publisher
ieee
ISSN
1530-437X
Type
jour
DOI
10.1109/JSEN.2009.2038573
Filename
5416591
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