Title :
Outage analysis of cooperative cellular network with hardware impairments
Author :
Kefeng Guo ; Jin Chen ; Guoxin Li ; Xueling Wang
Author_Institution :
Coll. of Commun. Eng., PLA Univ. of Sci. & Technol., Nanjing, China
Abstract :
Physical transceivers have hardware impairments that create distortions which degrade the performance of communication. This paper analyses the performance with partial relay selection in amplify-and-forward (AF) cooperative network with Hardware Impairments, where the relay node is selected depending on the instantaneous channel information of source-relay hop. The vast majority of technical contributions in the area of relaying neglect hardware impairments and which assume ideal hardware. This paper quantifies the impact of hardware impairments on dual-hop relaying network which uses AF protocol. The performance measured of the system is derived which is the outage probability over Rayleigh fading channel. And closed-form expression for the signal-to-noise ratio (SNR) is also determined. Combined with the other papers, this paper mainly uses the partial relaying selection and analyzes the hardware with impairments. We validate our analysis by comparing the performance with the network which has the ideal hardware in Rayleigh fading channels.
Keywords :
Rayleigh channels; amplify and forward communication; cellular radio; cooperative communication; probability; protocols; radio transceivers; relay networks (telecommunication); AF protocol; Rayleigh fading channel; SNR; amplify-and-forward cooperative network; closed-form expression; cooperative cellular network; dual-hop relaying network; hardware impairments; instantaneous channel information; outage probability analysis; partial relaying selection; relay node; signal-to-noise ratio; source-relay hop; transceivers; Analytical models; Cooperative systems; Fading; Hardware; Protocols; Relays; Signal to noise ratio; Cellular network; hardware impairments; outage probability analysis; partial relay selection;
Conference_Titel :
Information Science, Electronics and Electrical Engineering (ISEEE), 2014 International Conference on
Conference_Location :
Sapporo
Print_ISBN :
978-1-4799-3196-5
DOI :
10.1109/InfoSEEE.2014.6946153