• DocumentCode
    1421498
  • Title

    Discarding wide baseline mismatches with global and local transformation consistency

  • Author

    Zhou, H.B. ; Zhang, David Z. ; Chen, Ci ; Tian, J.W.

  • Author_Institution
    Inst. for Pattern Recognition & Artificial Intell., Huazhong Univ. of Sci. & Technol., Wuhan, China
  • Volume
    47
  • Issue
    1
  • fYear
    2011
  • Firstpage
    25
  • Lastpage
    26
  • Abstract
    A novel method called global and local transformation consistency constraints, which combines the scale, orientation and spatial layout information of `scale invariant feature transform` (SIFT) features, is proposed for discarding mismatches from given putative point correspondences. Experiments show that the proposed method can efficiently extract high-precision matches from low-precision putative SIFT matches for wide baseline image pairs, and outperforms or performs close to state-of-the-art approaches.
  • Keywords
    feature extraction; image matching; transforms; SIFT; discard wide baseline mismatch; feature extraction; global transformation consistency; high-precision match; local transformation consistency; scale invariant feature transform; spatial layout information; wide baseline image pair;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el.2010.2967
  • Filename
    5682182