DocumentCode
1421498
Title
Discarding wide baseline mismatches with global and local transformation consistency
Author
Zhou, H.B. ; Zhang, David Z. ; Chen, Ci ; Tian, J.W.
Author_Institution
Inst. for Pattern Recognition & Artificial Intell., Huazhong Univ. of Sci. & Technol., Wuhan, China
Volume
47
Issue
1
fYear
2011
Firstpage
25
Lastpage
26
Abstract
A novel method called global and local transformation consistency constraints, which combines the scale, orientation and spatial layout information of `scale invariant feature transform` (SIFT) features, is proposed for discarding mismatches from given putative point correspondences. Experiments show that the proposed method can efficiently extract high-precision matches from low-precision putative SIFT matches for wide baseline image pairs, and outperforms or performs close to state-of-the-art approaches.
Keywords
feature extraction; image matching; transforms; SIFT; discard wide baseline mismatch; feature extraction; global transformation consistency; high-precision match; local transformation consistency; scale invariant feature transform; spatial layout information; wide baseline image pair;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el.2010.2967
Filename
5682182
Link To Document