• DocumentCode
    1421724
  • Title

    Electron microscopes: present state and future prospects

  • Author

    Cosslett, V.E.

  • Author_Institution
    University of Cambridge, Electron Microscope Section, Department of Physics, Cavendish Laboratory, Cambridge, UK
  • Volume
    117
  • Issue
    8
  • fYear
    1970
  • fDate
    8/1/1970 12:00:00 AM
  • Firstpage
    1489
  • Lastpage
    1508
  • Abstract
    After an historical sketch of the development of the electron microscope, the main features of the various types of existing instruments are described. Attention is confined to those which are commercially available, and experimental models are discussed only when they embody significant new ideas. The emphasis is on design and operation. Applications are included only incidentally, and specimen preparation not at all. The transmission electron microscope is dealt with in greatest detail, followed in importance by the scanning electron microscope. Electron- and ion-emission microscopes are also described, and a brief account is given of mirror microscopes and the electron-probe microanalyser. To avoid repetition, certain features common to all or most of these instruments are discussed in an initial Section, in particular electron guns and magnetic lenses. The review concludes with an attempt to chart the further development of electron microscopes by extrapolation of some current trends in their design and uses.
  • Keywords
    electron microscopes;
  • fLanguage
    English
  • Journal_Title
    Electrical Engineers, Proceedings of the Institution of
  • Publisher
    iet
  • ISSN
    0020-3270
  • Type

    jour

  • DOI
    10.1049/piee.1970.0306
  • Filename
    5249293