Title :
Why nanovoltmeter offset currents do not explain measured deviations in the quantized Hall resistance
Author :
Inglis, D. ; Wood, B.
Author_Institution :
Inst. for Nat. Meas. Stand., Nat. Res. Council of Canada, Ottawa, Ont., Canada
Abstract :
T.P. Chen and H.A. Chua [ibid. vol. 47, pp. 592-594, 1998] have suggested that deviations in the value of resistance in QHR devices with resistive contacts may be attributable to the offset (or bias) current of the nanovoltmeter used to measure the QHR devices. We present two reasons why their explanation is unreasonable.
Keywords :
electric resistance measurement; measurement standards; measurement uncertainty; quantum Hall effect; voltmeters; bias current; contact resistance; measured deviations; nanovoltmeter offset currents; parasitic resistance; quantized Hall resistance; resistive contacts; Bridge circuits; Contact resistance; Current measurement; Electrical resistance measurement; Impedance; Nanoscale devices; Resistors; Time measurement; Voltage; Wire;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
