DocumentCode
1422442
Title
Why nanovoltmeter offset currents do not explain measured deviations in the quantized Hall resistance
Author
Inglis, D. ; Wood, B.
Author_Institution
Inst. for Nat. Meas. Stand., Nat. Res. Council of Canada, Ottawa, Ont., Canada
Volume
49
Issue
6
fYear
2000
Firstpage
1358
Lastpage
1359
Abstract
T.P. Chen and H.A. Chua [ibid. vol. 47, pp. 592-594, 1998] have suggested that deviations in the value of resistance in QHR devices with resistive contacts may be attributable to the offset (or bias) current of the nanovoltmeter used to measure the QHR devices. We present two reasons why their explanation is unreasonable.
Keywords
electric resistance measurement; measurement standards; measurement uncertainty; quantum Hall effect; voltmeters; bias current; contact resistance; measured deviations; nanovoltmeter offset currents; parasitic resistance; quantized Hall resistance; resistive contacts; Bridge circuits; Contact resistance; Current measurement; Electrical resistance measurement; Impedance; Nanoscale devices; Resistors; Time measurement; Voltage; Wire;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/19.893283
Filename
893283
Link To Document