Title :
Inverse Cerenkov acceleration and inverse free-electron laser experimental results for staged electron laser acceleration
Author :
Campbell, Lora P. ; Dilley, Christian E. ; Gottschalk, Stephen C. ; Kimura, Wayne D. ; Quimby, David C. ; Steinhauer, Loren C. ; Babzien, Marcus ; Ben-Zvi, Ilan ; Gallardo, Juan C. ; Kusche, Karl P., Jr. ; Pogorelsky, Igor V. ; Skaritka, John R. ; Van Ste
Author_Institution :
STI Optronics Inc., Bellevue, WA, USA
fDate :
8/1/2000 12:00:00 AM
Abstract :
The goal of the staged electron laser acceleration (STELLA) experiment is to demonstrate staging of the laser acceleration process whereby an inverse free electron laser (IFEL) will be used to prebunch the electrons, which are then accelerated in an inverse Cerenkov accelerator (ICA). As preparation for this experiment, a new permanent magnet wiggler for the IFEL was constructed and the ICA system was modified. Both systems have been tested on a new beamline specifically built for STELLA. The improved electron beam (e-beam) with its very low emittance (0.8 mm-mrad normalized) enabled focusing the e-beam to an average radius (1σ) of 65 μm, within the ICA interaction region. This small e-beam focus greatly enhanced the ICA process and resulted in electron energy spectra that have demonstrated the best agreement to date in both overall shape and magnitude with the model predictions. The electron energy spectrum using the new wiggler in the IFEL was also measured. These results will be described as well as future improvements to the STELLA experiment
Keywords :
electron accelerators; free electron lasers; wigglers; STELLA; electron beam; electron energy spectra; electrons prebunching; inverse Cerenkov acceleration; inverse free-electron laser; laser acceleration; permanent magnet wiggler; staged electron laser acceleration; Acceleration; Electron accelerators; Electron beams; Free electron lasers; Independent component analysis; Permanent magnets; Predictive models; Shape; System testing; Undulators;
Journal_Title :
Plasma Science, IEEE Transactions on