Title :
Replacing Error Vector Magnitude Test with RF and Analog BISTs
Author :
Webster, Dallas L. ; Hudgens, Rick ; Lie, D.Y.C.
Abstract :
RF and analog BIST techniques are capable of replacing the traditional error vector magnitude (EVM) test used in production. In a case study, four BISTs detected actual production faults in a commercial, highly integrated WLAN device. In combination with traditional digital testing, the BISTs caught an impressive 100% of EVM failures during production of over a million devices, which presents significant opportunities for both cost and time savings.
Keywords :
analogue circuits; built-in self test; integrated circuit reliability; integrated circuit testing; radiofrequency integrated circuits; wireless LAN; RF techniques; analog BIST techniques; error vector magnitude test; integrated WLAN device; Analog circuits; Error analysis; Modulation; Performance evaluation; Radio frequency; System-on-a-chip; Wireless LAN; BIST; CMOS integrated circuits; EVM; RF-BIST; RF-SoC; SoC; design and test; production test; self-calibration; self-testing; wireless LAN;
Journal_Title :
Design & Test of Computers, IEEE
