DocumentCode :
1422890
Title :
Comments, with reply, on "Reliability of modified designs-a Bayes analysis of an accelerated test of electronic assemblies" by L. Hart
Author :
Ganter, William A.
Author_Institution :
Production Autom. Inc., Boulder, CO, USA
Volume :
39
Issue :
5
fYear :
1990
Firstpage :
520
Lastpage :
522
Abstract :
In examining the above-named work (See ibid., vol.39, June 1990, p.140-4) of L. Hart, the commenter (Ganter) observes that Hart´s choice of a beta prior is reasonable and convenient only because it is well known that a beta prior yields a beta posterior in the Bayes method. It is argued that, because the binomial is exact, Hart can have no real justification for his beta prior from his A test results. Hart presents a reply. In addition, H.F. Martz and R. Fisher comment on the above exchange of views. They conclude that Ganter´s claim that Hart achieved no inference gain in using Bayes methods is unfounded. They argue that Ganter´s conclusion depends on the particular data set chosen and that his choice of ratio is inappropriate.<>
Keywords :
Bayes methods; life testing; reliability; Bayes method; accelerated testing; beta posterior; beta prior; electronic assemblies; inference gain; modified electronic designs; reliability; Assembly; Automatic testing; Design automation; Electronic equipment testing; Life estimation; Life testing; Manufacturing processes; Parameter estimation; Production; Sampling methods;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/24.61307
Filename :
61307
Link To Document :
بازگشت