Title :
Scaling optoelectronic-VLSI circuits into the 21st century: a technology roadmap
Author :
Krishnamoorthy, Ashok V. ; Miller, David A B
Author_Institution :
Lucent Technol. Bell Labs., Holmdel, NJ, USA
fDate :
4/1/1996 12:00:00 AM
Abstract :
Technologies now exist for implementing dense surface-normal optical interconnections for silicon CMOS VLSI using hybrid integration techniques. The critical factors in determining the performance of the resulting photonic chip are the yield on the transceiver device arrays, the sensitivity and power dissipation of the receiver and transmitter circuits, and the total optical power budget available. The use of GaAs-AlGaAs multiple-quantum-well p-i-n diodes for on-chip detection and modulation is one effective means of implementing the optoelectronic transceivers. We discuss a potential roadmap for the scaling of this hybrid optoelectronic VLSI technology as CMOS linewidths shrink and the characteristics of the hybrid optoelectronic transceiver technology improve. An important general conclusion is that, unlike electrical interconnects, such dense optical interconnections directly to an electronic circuit will likely be able to scale in capacity to match the improved performance of future CMOS technology
Keywords :
CMOS integrated circuits; VLSI; integrated circuit technology; integrated optoelectronics; optical interconnections; semiconductor quantum wells; technological forecasting; transceivers; 21st century; GaAs-AlGaAs; GaAs-AlGaAs multiple-quantum-well p-i-n diode; Si; dense surface-normal optical interconnections; device array; hybrid integration; modulation; on-chip detection; optical power budget; optoelectronic transceiver technology; optoelectronic-VLSI circuit scaling; photonic chip; power dissipation; sensitivity; silicon CMOS technology; yield; CMOS technology; Circuits; Optical arrays; Optical interconnections; Optical receivers; Optical transmitters; Power dissipation; Silicon; Transceivers; Very large scale integration;
Journal_Title :
Selected Topics in Quantum Electronics, IEEE Journal of
DOI :
10.1109/2944.541875