Title :
Nonparametric Estimation of Decreasing Mean Residual Life With Type II Censored Data
Author :
Shen, Yan ; Xie, Min ; Tang, Loon Ching
Author_Institution :
Dept. of Ind. & Syst. Eng., Nat. Univ. of Singapore, Singapore, Singapore
fDate :
3/1/2010 12:00:00 AM
Abstract :
In this paper, a nonparametric method is proposed for the estimation of decreasing mean residual life with type II censored data. This method is based on the comparison between two estimators of the reliability function: the Kaplan-Meier estimator, and an estimator derived from the empirical MRL function. Simulation results indicate that the new approach is able to give good performance, and can outperform some existing parametric methods when censoring is heavy.
Keywords :
reliability; Kaplan-Meier estimator; mean residual life; nonparametric estimation; nonparametric method; reliability engineering; reliability function; type II censored data; Decreasing mean residual life; nonparametric estimation; type II censoring;
Journal_Title :
Reliability, IEEE Transactions on
DOI :
10.1109/TR.2010.2040772