• DocumentCode
    1423460
  • Title

    Computational investigation of experimental interaction impedance obtained by perturbation for helical traveling-wave tube structures

  • Author

    Kory, Carol L. ; Dayton, James A., Jr.

  • Author_Institution
    NASA Lewis Res. Center, Cleveland, OH, USA
  • Volume
    45
  • Issue
    9
  • fYear
    1998
  • fDate
    9/1/1998 12:00:00 AM
  • Firstpage
    2063
  • Lastpage
    2071
  • Abstract
    Conventional methods used to measure the cold-test interaction impedance of helical slow-wave structures involve perturbing a helical circuit with a cylindrical dielectric rod placed on the central axis of the circuit. It has been shown that the difference in resonant frequency or axial phase shift between the perturbed and unperturbed circuits can be related to the interaction impedance. However, because of the complex configuration of the helical circuit, deriving this relationship involves several approximations. With the advent of accurate three-dimensional (3-D) helical circuit models, these standard approximations can be fully investigated. This paper addresses the most prominent approximations made in the analysis for measured interaction impedance by Lagerstrom (1957) and investigates their accuracy using the 3-D simulation code MAFIA. It is shown that a more accurate value of interaction impedance can be obtained by using 3-D computational methods rather than performing costly and time consuming experimental cold-test measurements
  • Keywords
    electric impedance; travelling wave tubes; 3D simulation code; MAFIA; cold test; cylindrical dielectric rod; helical traveling wave tube; interaction impedance; perturbation; phase shift; resonant frequency; three-dimensional helical circuit model; Circuit simulation; Computational modeling; Dielectric measurements; Frequency measurement; Impedance measurement; NASA; Performance evaluation; Phase measurement; Power system harmonics; Radio frequency;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.711375
  • Filename
    711375