Title :
A unified MOSFET channel charge model for device modeling in circuit simulation
Author :
Cheng, Yuhua ; Chen, Kai ; Imai, Kiyotoka ; Hu, Chenming
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
fDate :
8/1/1998 12:00:00 AM
Abstract :
In this paper, we present a simple and accurate MOSFET channel charge model for device modeling in circuit simulation. The model can guarantee good continuities and smooth transitions of charge, capacitance, current, and transconductance from subthreshold to strong inversion with a unified analytical expression, and agrees with the experimental data well at various process and bias conditions from subthreshold and strong inversion, including the moderate inversion region of growing importance for low-voltage/power circuits
Keywords :
MOSFET; semiconductor device models; MOSFET channel charge model; circuit simulation; device modeling; low-voltage low-power circuit; Capacitance; Circuit simulation; Differential equations; Doping; Helium; MOSFET circuits; Semiconductor process modeling; Threshold voltage; Transconductance; Very large scale integration;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on