Title :
Measurement of the Hygroscopic Swelling Coefficient of Thin Film Polymers Used in Semiconductor Packaging
Author :
Jang, Changsoo ; Yoon, Samson ; Han, Bongtae
Author_Institution :
Dept. of Mech. Eng., Univ. of Maryland, College Park, MD, USA
fDate :
6/1/2010 12:00:00 AM
Abstract :
An advanced method based on the digital image correlation technique is implemented for characterization of hygroscopic swelling of thin film polymers. The accuracy of the proposed method is experimentally validated through a comparison with the well-established Moiré interferometry technique. It is applied to various thin film polymers, including polyimide, solder resist, anisotropic conductive film, and thin woven glass/resin composite. The magnitude of hygroscopic swelling coefficients ranges from 0.067 to 0.25%strain/%wt for those films. A practical guideline for specimen preparation and experimental setup is provided for proper implementation of the proposed method.
Keywords :
interferometry; polymer films; resins; semiconductor device packaging; spatial variables measurement; swelling; thin films; Moire interferometry technique; anisotropic conductive film; digital image correlation technique; hygroscopic swelling coefficient measurement; resin composite; semiconductor packaging; solder resist; thin film polymers; thin woven glass; Digital image correlation; hygroscopic swelling coefficient; thin film polymer;
Journal_Title :
Components and Packaging Technologies, IEEE Transactions on
DOI :
10.1109/TCAPT.2009.2038366