Title :
Microprocessor Test and verification
Author :
Abadir, Magdy ; Dasgupta, S.
Author_Institution :
Motorola Inc.
Keywords :
Computer errors; Computer science; Data analysis; Delay effects; Electronic design automation and methodology; Error analysis; Microarchitecture; Microprocessors; Testing; Time to market;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2000.895001
