Title :
Test development for a third-version ColdFire microprocessor
Author :
Crouch, Alfred L. ; Mateja, Michael ; McLaurin, Teresa L. ; Potter, John C. ; Tran, Dat
Author_Institution :
Semicond. Products Sector, Motorola Inc., Austin, TX, USA
Abstract :
The design-for-test methodology of the MCF5307 device is described, illustrating issues faced, how solutions were derived, and results
Keywords :
built-in self test; logic testing; microprocessor chips; ColdFire microprocessor; MCF5307; design-for-test methodology; test development; Automatic test pattern generation; Automatic testing; Clocks; Design for testability; Flip-flops; Frequency; Microprocessors; Nearest neighbor searches; Phase locked loops; Sequential analysis;
Journal_Title :
Design & Test of Computers, IEEE
