• DocumentCode
    1424259
  • Title

    Test development for a third-version ColdFire microprocessor

  • Author

    Crouch, Alfred L. ; Mateja, Michael ; McLaurin, Teresa L. ; Potter, John C. ; Tran, Dat

  • Author_Institution
    Semicond. Products Sector, Motorola Inc., Austin, TX, USA
  • Volume
    17
  • Issue
    4
  • fYear
    2000
  • Firstpage
    29
  • Lastpage
    37
  • Abstract
    The design-for-test methodology of the MCF5307 device is described, illustrating issues faced, how solutions were derived, and results
  • Keywords
    built-in self test; logic testing; microprocessor chips; ColdFire microprocessor; MCF5307; design-for-test methodology; test development; Automatic test pattern generation; Automatic testing; Clocks; Design for testability; Flip-flops; Frequency; Microprocessors; Nearest neighbor searches; Phase locked loops; Sequential analysis;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/54.895004
  • Filename
    895004
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1424259