Title :
Effectiveness of microarchitecture test program generation
Author :
Utamaphethai, Noppanunt ; Blanton, R. D Shawn ; Shen, John Paul
Author_Institution :
Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
Abstract :
Investigation of a list of design errors typically encountered in industry is undertaken to determine if our microarchitecture test programs can detect them. Two metrics, functional and timing deviation are used to determine design error coverage
Keywords :
computer architecture; computer testing; microcomputers; design error coverage; design errors; metrics; microarchitecture; test program generation; Algorithm design and analysis; Circuit testing; Computer errors; Explosions; Formal verification; Logic circuits; Microarchitecture; Microprocessors; Pipelines; Timing;
Journal_Title :
Design & Test of Computers, IEEE
