Title :
Collection and analysis of microprocessor design errors
Author :
Van Campenhout, David ; Mudge, Trevor ; Hayes, John P.
Author_Institution :
Versity Design, Mountain View, CA, USA
Abstract :
Research on practical design verification techniques has long been impeded by the lack of published, detailed error data. We have systematically collected design error data over the last few years from a number of academic microprocessor design projects. We analyzed this data and report on the lessons learned in the collection effort
Keywords :
logic design; microprocessor chips; design verification; error data; microprocessor design; Computer crashes; Concrete; Data analysis; Delay effects; Error correction; Hardware design languages; Impedance; Microprocessors; Taxonomy; Virtual manufacturing;
Journal_Title :
Design & Test of Computers, IEEE
