Title :
Postsilicon validation methodology for microprocessors
Author :
Rotithor, Hemant
Author_Institution :
Core Archit. Group, Intel Corp., Hillsboro, OR, USA
Abstract :
A proposed methodology targets microarchitectural attributes prioritized based on the importance of validating corner cases. Several test templates cover all the critical attributes
Keywords :
logic testing; microprocessor chips; corner cases; microarchitectural attributes; microprocessors; test templates; validation methodology; Automatic testing; Built-in self-test; Computer bugs; Logic design; Logic testing; Microarchitecture; Microprocessors; Random number generation; Sequential analysis; System testing;
Journal_Title :
Design & Test of Computers, IEEE
