DocumentCode :
1424287
Title :
Passivity Verification of Delayed Rational Function Based Macromodels of Tabulated Networks Characterized by Scattering Parameters
Author :
Charest, Andrew ; Nakhla, Michel ; Achar, Ramachandra ; Saraswat, Dharmendra
Author_Institution :
Dept. of Electron., Carleton Univ., Ottawa, ON, Canada
Volume :
1
Issue :
3
fYear :
2011
fDate :
3/1/2011 12:00:00 AM
Firstpage :
386
Lastpage :
398
Abstract :
In this paper, a generalized theory for passivity verification of delayed rational function (DRF) macromodels representing electrically long networks that are characterized by multiport tabulated scattering parameters is presented. In the proposed approach, passivity verification of DRF macromodels is formulated as a quasi-periodic frequency-dependent generalized eigenvalue problem, using which, the necessary search region for passivity violations is reduced to just a single period along the imaginary axis. Necessary theoretical foundations and the related proofs are developed. Further, a computationally more efficient method based on half-Hamiltonian size frequency-dependent generalized eigenvalue problem is developed. Numerical validations for both the full-size and half-size formulations are also presented.
Keywords :
S-parameters; delays; eigenvalues and eigenfunctions; microstrip couplers; multiport networks; network analysis; passive networks; rational functions; transient analysis; delayed rational function macromodel; half-Hamiltonian size frequency-dependent generalized eigenvalue problem; imaginary axis; microstrip coupler; multiport tabulated scattering parameter; passivity verification; quasiperiodic frequency-dependent generalized eigenvalue problem; transient analysis; Delay; Eigenvalues and eigenfunctions; Equations; Manufacturing; Scattering; Scattering parameters; Transmission line matrix methods; Delayed differential equations; Hamiltonian matrix; delayed rational functions; frequency-dependent generalized eigenvalue problem; high-speed interconnects; macromodeling; passivity; scattering parameters; tabulated data networks; transient analysis;
fLanguage :
English
Journal_Title :
Components, Packaging and Manufacturing Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
2156-3950
Type :
jour
DOI :
10.1109/TCPMT.2010.2099750
Filename :
5686885
Link To Document :
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