Title :
Effects of process learning and product lifecycle on risk-based quality control plans
Author :
Bettayeb, Belgacem ; Bassetto, Samuel-Jean
Author_Institution :
Dept. of Math. & Ind. Eng., Montreal Polytech., Montreal, QC, Canada
fDate :
March 31 2014-April 3 2014
Abstract :
This paper studies the effects of process learning and product lifecycle phenomena on risk-based quality control plans (RBQCP) in the context of job shop manufacturing systems. The risk-based approach is tested and evaluated through several configurations representative of the dynamics of the aforementioned phenomena. The results confirm the robustness of the risk-based approach and underline the importance of managing products´ lifecycles in accordance with the available inspection resources and a threshold of risk exposure judiciously predefined.
Keywords :
inspection; job shop scheduling; learning (artificial intelligence); manufacturing systems; planning; product life cycle management; production engineering computing; quality control; risk management; RBQCP; dynamics configurations representative; inspection resources; job shop manufacturing systems; process learning; product lifecycle management; risk exposure; risk-based approach; risk-based quality control plans; Inspection; Integrated circuits;
Conference_Titel :
Systems Conference (SysCon), 2014 8th Annual IEEE
Conference_Location :
Ottawa, ON
Print_ISBN :
978-1-4799-2087-7
DOI :
10.1109/SysCon.2014.6819303
