DocumentCode

1424579

Title

Design methodology of a robust ESD protection circuit for STI process 256 Mb NAND flash memory

Author

Ikehashi, Tamio ; Imamiya, K. ; Sakui, Koji

Author_Institution

TOSHIBA Corporation

Volume

23

Issue

4

fYear

2000

fDate

10/1/2000 12:00:00 AM

Firstpage

235

Lastpage

235

Keywords

Circuits; Design methodology; Electrostatic discharge; Footwear; Manufacturing; Moisture; Protection; Robustness; Testing; Wrist;

fLanguage

English

Journal_Title

Electronics Packaging Manufacturing, IEEE Transactions on

Publisher

ieee

ISSN

1521-334X

Type

jour

DOI

10.1109/TEPM.2000.895053

Filename

895053