Title :
Design methodology of a robust ESD protection circuit for STI process 256 Mb NAND flash memory
Author :
Ikehashi, Tamio ; Imamiya, K. ; Sakui, Koji
Author_Institution :
TOSHIBA Corporation
fDate :
10/1/2000 12:00:00 AM
Keywords :
Circuits; Design methodology; Electrostatic discharge; Footwear; Manufacturing; Moisture; Protection; Robustness; Testing; Wrist;
Journal_Title :
Electronics Packaging Manufacturing, IEEE Transactions on
DOI :
10.1109/TEPM.2000.895053
