Title :
A Low-Power Continuously-Calibrated Clock Recovery Circuit for UHF RFID EPC Class-1 Generation-2 Transponders
Author :
Chan, Chi-Fat ; Pun, Kong-Pang ; Leung, Ka-Nang ; Guo, Jianping ; Leung, Lai-Kan Lincoln ; Choy, Chiu-Sing
Author_Institution :
Hong Kong Appl. Sci. & Technol. Res. Inst., Shatin, China
fDate :
3/1/2010 12:00:00 AM
Abstract :
A low-power, reliable and re-configurable clock recovery circuit for UHF RFID transponders for the EPC Class-1 Generation-2 standard is proposed. Based on a digital frequency-locked loop, the clock recovery circuit uses timing information available in the downlink data, namely, the pulse intervals of the PIE-coded data, to calibrate an oscillator´s output frequency to meet the stringent frequency accuracy requirement of the standard. Fabricated in a 0.18-¿m standard CMOS technology, the clock recovery circuit provides a calibrated frequency of 2.56 MHz with a frequency deviation within the range from -3.2% to +1.2% over process, supply voltage and temperature variations. The chip has an active area of 0.22 ¿m2, operates from a supply voltage from 0.75 V to 1.3 V, and consumes less than 2 ¿W for a 1-V supply.
Keywords :
CMOS integrated circuits; frequency locked loops; low-power electronics; oscillators; radiofrequency identification; synchronisation; timing circuits; transponders; CMOS technology; PIE-coded data; UHF RFID EPC Class-1 Generation-2 transponders; UHF RFID transponders; digital frequency-locked loop; downlink data; frequency 2.56 MHz; frequency deviation; low-power continuously-calibrated clock recovery circuit; oscillator output frequency; pulse intervals; reconfigurable clock recovery circuit; size 0.18 mum; stringent frequency accuracy requirement; timing information; voltage 75 V to 1.3 V; CMOS technology; Clocks; Downlink; Frequency locked loops; Pulse circuits; Radiofrequency identification; Timing; Transponders; UHF circuits; Voltage; Clock recovery; digital frequency-locked loop; passive RFID transponder;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2010.2040655