Title :
Processing and reliability of fast-flow, snap-cure underfills. I. Processing and moisture sensitivity
Author :
Baldwin, Daniel F. ; Houston, Paul N. ; Deladisma, Marnico ; Crane, Lawrence N. ; Konarski, Mark M.
Author_Institution :
George W. Woodruff Sch. of Mech. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
fDate :
10/1/2000 12:00:00 AM
Abstract :
This series of articles studies the processing, moisture sensitivity, reliability, and failure mode analysis of a number of commercial fast-flow, snap-cure underfill materials. It includes data on process analysis, processing times, and reliability of the test vehicles in air-to-air thermal cycling (-55°C to 125°C), liquid to liquid thermal shock (-55°C to 125°C), and J Standard 020 Revision A Level 3 Moisture Sensitivity Preconditioning followed by reliability testing. Samples cured using a second reflow pass are compared to baseline samples cured in a standard batch oven based on the underfill manufacturer´s recommended cure schedule. Results from the processing of these new materials have shown a greatly reduced flow time from earlier generation underfill materials as all of these materials had flow times of less than 30 s under 5-mm test die. Through differential scanning calorimetry analysis, it was shown that materials requiring less than 8 min to cure exhibited at least 95% conversion (percentage of material cured) through the modified second side renew profile. Some of these commercial underfills have also passed J Standard 020 Revision A Level 3 Moisture Sensitivity testing. Specifically in this paper, the flip chip processing, underfill processing, moisture preconditioning, and preconditioning failure modes are presented
Keywords :
chip-on-board packaging; circuit reliability; differential scanning calorimetry; environmental testing; failure analysis; flip-chip devices; moisture; printed circuit manufacture; reflow soldering; surface mount technology; thermal shock; -55 to 125 C; J Standard 020 Revision A Level 3 test; SMT reflow cycle soak stages; air-to-air thermal cycling; differential scanning calorimetry; double sided board assembly; failure mode analysis; fast-flow snap-cure underfills; flip chip technology; liquid to liquid thermal shock; moisture preconditioning; moisture sensitivity; preconditioning failure modes; processing sensitivity; processing times; reflow spike; reliability; second side interconnects; Data analysis; Electric shock; Failure analysis; Job shop scheduling; Manufacturing; Materials reliability; Moisture; Ovens; Testing; Vehicles;
Journal_Title :
Electronics Packaging Manufacturing, IEEE Transactions on
DOI :
10.1109/6104.895070