DocumentCode
142495
Title
Examination of microwave forward reflection from a randomly rough lossy dielectric surface
Author
Sinmyeong Park ; Soon-Koo Kweon ; Yisok Oh
Author_Institution
Dept. of Electron. Inf. & Commun. Eng., Hongik Univ., Seoul, South Korea
fYear
2014
fDate
13-18 July 2014
Firstpage
332
Lastpage
334
Abstract
We examined the forward reflection from a randomly rough lossy dielectric surface and the accuracy of the forward reflection model. The moment method could be used to compute the forward reflection coefficient. We also examined the effect of correlation length on various correlation length and RSM height. The forward reflection coefficient of a randomly rough surface is computed by the (1) or (2), but the exponential term in (1) goes to zero for a large value of khrms. On the other hand, (2) is stable for a large value of khrms. But (1) and (2) are function of only the RMS height. We will show the effect of correlation length from reflection coefficient. We will also show the modify reflection model with correlation factor for forward reflection from a rough lossy dielectric surface.
Keywords
geophysical techniques; rough surfaces; seawater; soil; RSM height function; correlation length effect; exponential term; forward reflection coefficient; forward reflection correlation factor; forward reflection model accuracy; large khrms value; microwave forward reflection examination; moment method; randomly rough lossy dielectric surface; reflection coefficient; reflection model modification; Computational modeling; Correlation; Optical surface waves; Reflection coefficient; Rough surfaces; Sea surface; Surface roughness; Forward reflection; RMS height; correlation length; randomly rough surface; reflection coefficient; reflection model;
fLanguage
English
Publisher
ieee
Conference_Titel
Geoscience and Remote Sensing Symposium (IGARSS), 2014 IEEE International
Conference_Location
Quebec City, QC
Type
conf
DOI
10.1109/IGARSS.2014.6946425
Filename
6946425
Link To Document