Title :
Petri net-based response policies to process module failure in time-constrained single-arm cluster tools
Author :
Yan Qiao ; NaiQi Wu ; ChunRong Pan ; Mengchu Zhou
Author_Institution :
Sch. of Electromech. Eng., Guangdong Univ. of Technol., Guangzhou, China
Abstract :
For wafer fabrication, a process module (PM) in cluster tools is prone to failure. It is crucial to deal with such failure in a proper and timely manner. With residency time constraints, if there are feasible periodic schedules in operating a cluster tool before and after a PM failure, it is desired to make it operate continuously when such a failure occurs. A Petri net model is developed to describe the dynamic behavior of a single-arm cluster tool and failure response policies are proposed to deal with a failure. The proposed policies are formulated via simple control laws for their real-time and on-line implementation. An example is presented to show their application.
Keywords :
Petri nets; machine tools; quality control; semiconductor industry; semiconductor technology; PM failure; Petri net-based response policies; control laws; failure response policies; process module failure; residency time constraints; time-constrained single-arm cluster tools; wafer fabrication; Tin; Cluster tools; Failure response; Petri net; Scheduling; Semiconductor manufacturing;
Conference_Titel :
Networking, Sensing and Control (ICNSC), 2014 IEEE 11th International Conference on
Conference_Location :
Miami, FL
DOI :
10.1109/ICNSC.2014.6819615