• DocumentCode
    142520
  • Title

    Petri net-based response policies to process module failure in time-constrained single-arm cluster tools

  • Author

    Yan Qiao ; NaiQi Wu ; ChunRong Pan ; Mengchu Zhou

  • Author_Institution
    Sch. of Electromech. Eng., Guangdong Univ. of Technol., Guangzhou, China
  • fYear
    2014
  • fDate
    7-9 April 2014
  • Firstpage
    144
  • Lastpage
    149
  • Abstract
    For wafer fabrication, a process module (PM) in cluster tools is prone to failure. It is crucial to deal with such failure in a proper and timely manner. With residency time constraints, if there are feasible periodic schedules in operating a cluster tool before and after a PM failure, it is desired to make it operate continuously when such a failure occurs. A Petri net model is developed to describe the dynamic behavior of a single-arm cluster tool and failure response policies are proposed to deal with a failure. The proposed policies are formulated via simple control laws for their real-time and on-line implementation. An example is presented to show their application.
  • Keywords
    Petri nets; machine tools; quality control; semiconductor industry; semiconductor technology; PM failure; Petri net-based response policies; control laws; failure response policies; process module failure; residency time constraints; time-constrained single-arm cluster tools; wafer fabrication; Tin; Cluster tools; Failure response; Petri net; Scheduling; Semiconductor manufacturing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Networking, Sensing and Control (ICNSC), 2014 IEEE 11th International Conference on
  • Conference_Location
    Miami, FL
  • Type

    conf

  • DOI
    10.1109/ICNSC.2014.6819615
  • Filename
    6819615