DocumentCode
142520
Title
Petri net-based response policies to process module failure in time-constrained single-arm cluster tools
Author
Yan Qiao ; NaiQi Wu ; ChunRong Pan ; Mengchu Zhou
Author_Institution
Sch. of Electromech. Eng., Guangdong Univ. of Technol., Guangzhou, China
fYear
2014
fDate
7-9 April 2014
Firstpage
144
Lastpage
149
Abstract
For wafer fabrication, a process module (PM) in cluster tools is prone to failure. It is crucial to deal with such failure in a proper and timely manner. With residency time constraints, if there are feasible periodic schedules in operating a cluster tool before and after a PM failure, it is desired to make it operate continuously when such a failure occurs. A Petri net model is developed to describe the dynamic behavior of a single-arm cluster tool and failure response policies are proposed to deal with a failure. The proposed policies are formulated via simple control laws for their real-time and on-line implementation. An example is presented to show their application.
Keywords
Petri nets; machine tools; quality control; semiconductor industry; semiconductor technology; PM failure; Petri net-based response policies; control laws; failure response policies; process module failure; residency time constraints; time-constrained single-arm cluster tools; wafer fabrication; Tin; Cluster tools; Failure response; Petri net; Scheduling; Semiconductor manufacturing;
fLanguage
English
Publisher
ieee
Conference_Titel
Networking, Sensing and Control (ICNSC), 2014 IEEE 11th International Conference on
Conference_Location
Miami, FL
Type
conf
DOI
10.1109/ICNSC.2014.6819615
Filename
6819615
Link To Document