Title :
Lifetime Prediction of Non-Collapsible Solder Joints in LTCC/PWB Assemblies Using a Recalibrated Engelmaier´s Model
Author :
Putaala, Jussi ; Salmela, Olli ; Nousiainen, Olli ; Kangasvieri, Tero ; Uusimäki, Antti
Author_Institution :
Microelectron. & Mater. Phys. Labs., Univ. of Oulu, Oulu, Finland
fDate :
6/1/2012 12:00:00 AM
Abstract :
The thermal fatigue endurances of lead-free (φ 500 and 1100 μm) plastic core solder ball (PCSB) ball grid array interconnections were investigated. The test assemblies were exposed to thermal cycling testing in temperature ranges of 0-100°C and -40 to +125°C. In addition, optical microscopy and scanning electron microscopy were used to characterize the interconnections. The characteristic lifetime data from this and earlier studies were contrasted with a recalibrated Engelmaier´s model. After adjusting the model, feasibility was determined through test results of a partial array representing a real-use case. On the basis of this paper it was found that the recalibrated Engelmaier´s model is, after adjustment, a suitable model for predicting the lifetime of PCSB assemblies.
Keywords :
assembling; ball grid arrays; calibration; ceramic packaging; cores; optical microscopy; plastic packaging; printed circuit interconnections; printed circuit testing; scanning electron microscopy; solders; thermal stress cracking; LTCC-PWB assembly; PCSB assembly lifetime prediction; lead-free PCSB ball grid array interconnection; lead-free plastic core solder ball ball grid array interconnection; lifetime data characteristic; noncollapsible solder joint; optical microscopy; partial array representation; recalibrated Engelmaier model; scanning electron microscopy; size 1100 mum; size 500 mum; temperature -40 degC to 125 degC; temperature 0 degC to 100 degC; test assembly; thermal cycling testing; thermal fatigue endurance; Arrays; Joints; Materials; Predictive models; Reliability; Soldering; Ball grid array; Engelmaier; low-temperature cofired ceramic; reliability;
Journal_Title :
Components, Packaging and Manufacturing Technology, IEEE Transactions on
DOI :
10.1109/TCPMT.2011.2177090