DocumentCode :
1425819
Title :
Fast Waveform Estimation (FWE) for Timing Analysis
Author :
Xu, Jingye ; Chowdhury, Masud H.
Author_Institution :
Univ. of Illinois at Chicago, Chicago, IL, USA
Volume :
19
Issue :
5
fYear :
2011
fDate :
5/1/2011 12:00:00 AM
Firstpage :
846
Lastpage :
856
Abstract :
This paper proposes a new technique, fast waveform estimation (FWE), to quickly and accurately estimate the output waveform for general resistance-capacitance (RC) interconnect networks in the presence of coupling noise. It is a common view that the traditional transient analysis is not feasible for full-chip timing analysis. The static methods suffer from inaccuracy and inability to capture the non-monotonic nature of signal waveform in the presence of coupling noise. The dynamic methods, such as, general model order reduction techniques provide a good compromise between the accuracy and efficiency. But they make no use of the typical topological structures of the general RC interconnect networks. The proposed FWE technique achieves a better overall performance through topological reduction of the general RC interconnect networks. It is demonstrated that the accuracy of the proposed method is comparable to the general model order reduction-based methods while maintaining an efficiency that is comparable to Elmore delay based analysis.
Keywords :
RC circuits; integrated circuit interconnections; integrated circuit noise; waveform analysis; Elmore delay based analysis; RC interconnect networks; coupling noise; fast waveform estimation; general model order reduction techniques; general model order reduction-based methods; integrated circuit technology; resistance-capacitance interconnect networks; signal waveform; static methods; timing analysis; transient analysis; Analytical models; Circuit simulation; Coupling circuits; Crosstalk; Delay effects; Delay estimation; Integrated circuit interconnections; Integrated circuit technology; Timing; Transient analysis; Circuit simulation; timing analysis;
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/TVLSI.2010.2041801
Filename :
5419967
Link To Document :
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