DocumentCode
1425857
Title
Analysis and Comparison in the Energy-Delay-Area Domain of Nanometer CMOS Flip-Flops: Part I—Methodology and Design Strategies
Author
Alioto, Massimo ; Consoli, Elio ; Palumbo, Gaetano
Author_Institution
Dipt. di Ing. dell´´Inf. (DII), Univ. di Siena, Siena, Italy
Volume
19
Issue
5
fYear
2011
fDate
5/1/2011 12:00:00 AM
Firstpage
725
Lastpage
736
Abstract
In this paper (split into Parts I and II), an extensive comparison of existing flip-flop (FF) classes and topologies is carried out. In contrast to previous works, analysis explicitly accounts for effects that arise in nanometer technologies and affect the energy-delay-area tradeoff (e.g., leakage and the impact of layout and interconnects). Compared to previous papers on FFs comparison, the analysis involves a significantly wider range of FF classes and topologies. In particular, in this Part I, the comparison strategy, which includes the simulation setup, the energy-delay estimation methodology, and an overview of an optimum design strategy, together with the introduction of the analyzed FF classes and topologies, are reported.
Keywords
CMOS logic circuits; delay estimation; flip-flops; integrated circuit interconnections; energy-delay estimation; energy-delay-area domain; interconnects; layout impact; nanometer CMOS flip-flops; optimum design; Analytical models; CMOS technology; Circuit topology; Clocks; Energy efficiency; Flip-flops; Integrated circuit interconnections; Integrated circuit technology; Space technology; Very large scale integration; Clocking; Logical Effort; VLSI; energy efficiency; energy-delay tradeoff; flip-flops (FFs); high speed; interconnects; leakage; low power; nanometer technologies;
fLanguage
English
Journal_Title
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher
ieee
ISSN
1063-8210
Type
jour
DOI
10.1109/TVLSI.2010.2041376
Filename
5419974
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