DocumentCode :
1426009
Title :
Investigation on the Retention Reliability of Scaled 
Inter-Poly Dielectrics for nand Flash memory; High-$k$
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/LED.2009.2039985
Filename :
5419996
Link To Document :
