• DocumentCode
    1426013
  • Title

    Fault diagnosis of a distributed knockout switch

  • Author

    Cheng, Y.-J. ; Lee, T.-H. ; Shen, W.-Z.

  • Author_Institution
    Appl. Technol. Lab., Chunghwa Telecom Co. Ltd., Taoyuan, Taiwan
  • Volume
    145
  • Issue
    4
  • fYear
    1998
  • fDate
    8/1/1998 12:00:00 AM
  • Firstpage
    241
  • Lastpage
    248
  • Abstract
    The distributed knockout switch has multiple paths between any input and output pair and thus is inherently robust to faults without the need of adding any additional switch elements. However, to achieve fault tolerance, one has to first detect and locate the faults. The authors present an efficient fault diagnosis procedure to detect, locate, and identify the fault type of single switch element faults for the switch element array of the distributed knockout switch. To facilitate fault diagnosis, the operation of switch elements is slightly modified. The diagnosis procedure can locate most single switch element faults in two phases. Faults which cannot be located in two phases can always be located in a third phase. Binary search algorithms are developed to locate some kinds of single switch element faults in the third phase
  • Keywords
    asynchronous transfer mode; distributed processing; electronic equipment testing; fault diagnosis; search problems; ATM switch; binary search algorithms; distributed knockout switch; efficient fault diagnosis procedure; fault diagnosis; fault identification; fault location; fault tolerance; multiple paths; switch element array; switch elements;
  • fLanguage
    English
  • Journal_Title
    Communications, IEE Proceedings-
  • Publisher
    iet
  • ISSN
    1350-2425
  • Type

    jour

  • DOI
    10.1049/ip-com:19982136
  • Filename
    714379