DocumentCode
1426165
Title
Toward shorter wavelength lasers and soft X-ray laser microscopy
Author
Skinner, C.H. ; Dicicco, D. ; Kim, D. ; Meixler, L. ; Nam, C.H. ; Tighe, W. ; Suckewer, S.
Author_Institution
Plasma Phys. Lab., Princeton Univ., NJ, USA
Volume
16
Issue
5
fYear
1988
fDate
10/1/1988 12:00:00 AM
Firstpage
512
Lastpage
519
Abstract
The authors present two approaches to X-ray laser development at Princeton and review progress toward the wavelength region below 10 nm. In addition, they present the first results from the application of the existing soft X-ray laser at 18.2 nm to X-ray microscopy. Particular emphasis is placed on experimentation with Li-like ions, the modeling of Li-like plasmas, cavity development, and a two-laser approach to wavelengths significantly below 10 nm
Keywords
X-ray lasers; ion lasers; isoelectronic series; laser beam applications; microscopy; plasma production and heating by laser beam; plasma simulation; 10 nm; 18.2 nm; Li-like plasmas; X-ray microscopy; cavity development; laser development; review; shorter wavelength lasers; soft X-ray laser microscopy; Gain measurement; Laser theory; Microscopy; Plasma applications; Plasma confinement; Plasma density; Plasma measurements; Plasma x-ray sources; Surface emitting lasers; X-ray lasers;
fLanguage
English
Journal_Title
Plasma Science, IEEE Transactions on
Publisher
ieee
ISSN
0093-3813
Type
jour
DOI
10.1109/27.8958
Filename
8958
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