DocumentCode :
14265
Title :
Switched Bias Differential MOSFET Dosimeter
Author :
Garcia-Inza, M. ; Carbonetto, S. ; Lipovetzky, J. ; Carra, M.J. ; Sambuco Salomone, L. ; Redin, E.G. ; Faigon, A.
Author_Institution :
Device Phys.-Microelectron. Lab., Univ. de Buenos Aires, Buenos Aires, Argentina
Volume :
61
Issue :
3
fYear :
2014
fDate :
Jun-14
Firstpage :
1407
Lastpage :
1413
Abstract :
This paper presents a differential MOSFET sensor reading technique based on the bias controlled cycled measurement. The circuit was implemented, and tested with gamma radiation from a 60-cobalt source. Temperature rejection performance was assessed during the exposure in real-time measurements. The results show that in comparison with a single MOSFET dosimeter the thermal drift is 20 times smaller and the radiation sensitivity is approximately 10% higher. The switched biasing allows to extend the measurement range beyond MOSFET´s threshold voltage saturation.
Keywords :
MOSFET; dosimeters; 60-cobalt source; MOSFET threshold voltage saturation; bias controlled cycled measurement; differential MOSFET sensor reading technique; gamma radiation; switched bias differential MOSFET dosimeter; temperature rejection performance; Logic gates; MOSFET; Sensitivity; Switches; Temperature measurement; Temperature sensors; Threshold voltage; MOS sensors; MOSFET dosimeter; radiation effects; solid-state detectors;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2014.2316337
Filename :
6819076
Link To Document :
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