• DocumentCode
    1426799
  • Title

    A Distribution-Based Systems Reliability Model Under Extreme Shocks and Natural Degradation

  • Author

    Ye, Zhi Sheng ; Tang, Loon Ching ; Xu, Hai Yan

  • Author_Institution
    Dept. of Ind. & Syst. Eng., Nat. Univ. of Singapore, Singapore, Singapore
  • Volume
    60
  • Issue
    1
  • fYear
    2011
  • fDate
    3/1/2011 12:00:00 AM
  • Firstpage
    246
  • Lastpage
    256
  • Abstract
    Degradation, and shock are two common mechanisms accounting for product failures. This paper presents a convenient means of capturing both shock and degradation in a single model when the extent of degradation and the magnitude of shocks are not observable, but only the failure times and the corresponding failure modes are recorded. We assume that the lifetime of a degradation-oriented failure, which is regarded as some initial random resource, belongs to some distribution family. Shocks arrive according to a non-homogeneous Poisson process, and the destructive probability depends on the transformed remaining resource of the system. Under these assumptions, we propose the single failure time model, and the recurrent event model. This study complements the well-known Brown-Proschan model. The single failure time model has successfully been applied to a real time data set. We also conduct a simulation study to examine the accuracy of our model.
  • Keywords
    failure analysis; probability; random processes; real-time systems; reliability; shock absorbers; stochastic processes; Brown-Proschan model; degradation-oriented failure; destructive probability; distribution family; distribution-based systems reliability model; extreme shocks; failure modes; failure times; initial random resource; natural degradation; non-homogeneous Poisson process; product failures; real time data set; recurrent event model; simulation study; single failure time model; Brown-Proschan model; extreme shock; hazard potential; multiple failure modes; natural failure;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.2010.2103710
  • Filename
    5688218