DocumentCode :
1427051
Title :
Quantitative method for evaluating quality of analogue VLSI layout
Author :
Wu, P.B. ; Mack, R.J. ; Massara, R.E.
Author_Institution :
Dept. of Electron. Syst. Eng., Essex Univ., Colchester, UK
Volume :
147
Issue :
6
fYear :
2000
fDate :
12/1/2000 12:00:00 AM
Firstpage :
313
Lastpage :
318
Abstract :
A quantitative benchmarking metric is presented for the evaluation of the quality of analogue layout. It facilitates comparisons between alternative design automation tools and, for a given tool, provides assessment of each layout instance. The quality metric reflects two principal concerns in layout design: area efficiency and net routing optimality. The algorithm has been developed to accommodate hierarchical structures, as well as flat designs. The metric allows the designer to alter the relative importance of area and routing efficiencies, although a recommendation is given on the appropriate balance. The results demonstrate the use of the metric to evaluate an automatic layout tool, and its effectiveness in providing a characterisation that corresponds to the expert designer´s judgement
Keywords :
VLSI; analogue integrated circuits; circuit layout CAD; circuit optimisation; integrated circuit layout; network routing; analogue VLSI layout; area efficiency; automatic layout tool; design automation tools; flat designs; hierarchical structures; layout design; layout instance; net routing optimality; quantitative benchmarking metric; routing efficiencies;
fLanguage :
English
Journal_Title :
Circuits, Devices and Systems, IEE Proceedings -
Publisher :
iet
ISSN :
1350-2409
Type :
jour
DOI :
10.1049/ip-cds:20000775
Filename :
895959
Link To Document :
بازگشت